Application of In-situ TEM Nanoscale Quantitative Mechanical Testing to Elastomers

In-Situ Mechanical Testing of Nano-Component in TEM

The In-situ Mechanical Testing of Nanoscale Single-crystalline Nanopillars

Common materials like metals appear to have unique and interesting properties when reduced to nanoscale. One example is that they become signifi cantly stronger, exhibiting strengths an order of magnitude higher than bulk. Understanding material strength at the appropriate scale is crucial in the design and reliable functioning of devices comprised of these materials. This article reviews recen...

Nanoscale Abrasive Wear of CoCrMo in In Situ TEM Sliding

The mechanical behaviour of materials at nanometre dimensions has been a major recent topic of research. In this study, the wear properties of a *60-nm thin foil made of the ductile fcc phase of a CoCrMo alloy were examined using in situ sliding test in a transmission electron microscope by sliding a silicon AFM tip on the fcc matrix under an applied normal load of 416–1,279 nN. The material ne...

Quantitative In Situ Mechanical Testing in Electron Microscopes

M. Legros, D.S. Gianola, and C. Motz about the surface (e.g., optical and SEM) but have some advantages with regard to temporal resolution over 3D probing technologies, which can require long acquisition times to enhance the signal quality. Figure 1 is a three-axis map of the main in situ tools used to investigate deformation mechanisms. The first two axes are the strain resolution and the leng...

Double-tilt in situ TEM holder with multiple electrical contacts and its application in MEMS-based mechanical testing of nanomaterials.

MEMS and other lab-on-a-chip systems are emerging as attractive alternatives to carry out experiments in situ the electron microscope. However, several electrical connections are usually required for operating these setups. Such connectivity is challenging inside the limited space of the TEM side-entry holder. Here, we design, implement and demonstrate a double-tilt TEM holder with capabilities...